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Electron & Ion Sources

LMIS is the answer to high resolution, focused ion beam (FIB) imaging, nanofabrication, depth profiling, SIMS*, ion doping and ion beam lithography. FEI uses LMIS in a variety of configurations: FIB columns, FIB systems, and DualBeam systems.

FEI Company

North America NanoPort 5350 NE Dawson Creek Drive Hillsboro, Oregon,USA.

UNITED STATES

+1 (503) 726-7500

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